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Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)
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Cited by 7
09:14 min
October 2nd, 2012
Topology of cell adhesion on a substrate is measured with nanometre precision by variable-angle total internal reflection fluorescence microscopy (VA-TIRFM).
Chapters in this video
0:05
Title
1:40
Seeding and Incubation of Cells
2:47
VA-TIRFM
5:26
Data Analysis
6:45
Results: Calculation of Cell-substrate Distances in Glioblastoma Cells
8:32
Conclusion
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