Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)

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Cited by 7

09:14 min

October 2nd, 2012

10.3791/4133-v

October 2nd, 2012

9.6K views

Topology of cell adhesion on a substrate is measured with nanometre precision by variable-angle total internal reflection fluorescence microscopy (VA-TIRFM).

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Variable Angle TIRFM

Chapters in this video

0:05

Title

1:40

Seeding and Incubation of Cells

2:47

VA-TIRFM

5:26

Data Analysis

6:45

Results: Calculation of Cell-substrate Distances in Glioblastoma Cells

8:32

Conclusion

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