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JoVE Journal Bioengineering
Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)
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Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)

Article DOI: 10.3791/4133-v • 09:15 min • October 2nd, 2012
October 2nd, 2012 •
1, 1, 1, 1
1Hochschule Aalen, Institut für Angewandte Forschung

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Summary
Automatic Translation

Topology of cell adhesion on a substrate is measured with nanometre precision by variable-angle total internal reflection fluorescence microscopy (VA-TIRFM).

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Nanotopology Cell Adhesion Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM) Surface Topology Substrate Nanometer Precision Transparent Slides Fluorescent Marker Plasma Membrane Illumination Laser Beam Total Internal Reflection (TIR) Evanescent Electromagnetic Field Fluorescence Images Cell-substrate Distances Adhesion Differences Cell Lines Cancer Cells Malignant Cells Chemical Treatment Photodynamic Treatment Super-resolution Microscopy
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