Topology of cell adhesion on a substrate is measured with nanometre precision by variable-angle total internal reflection fluorescence microscopy (VA-TIRFM).
Wagner, M., Weber, P., Baumann, H., Schneckenburger, H. Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM). J. Vis. Exp. (68), e4133, doi:10.3791/4133 (2012).