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October 02, 2012
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Topology of cell adhesion on a substrate is measured with nanometre precision by variable-angle total internal reflection fluorescence microscopy (VA-TIRFM).
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Cite this Article
Wagner, M., Weber, P., Baumann, H., Schneckenburger, H. Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM). J. Vis. Exp. (68), e4133, doi:10.3791/4133 (2012).
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