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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
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JoVE Journal Engineering
In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

DOI:
10.3791/53870-v

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10:42 min

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June 16, 2016

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, , ,
1Department Lippstadt,Hamm-Lippstadt University of Applied Sciences

Chapters

  • 00:05Title
  • 01:14Performance of Computed Tomography (CT) Scan
  • 03:07Micro Preparation
  • 05:06Light Microscopy (LM) Measurement Setup
  • 06:15Light Microscopy Characterization
  • 07:16Scanning Electron Microscopy (SEM) Analysis
  • 08:32Results: Comprehensive Micro-characterization of an Active Light Emitting Diode
  • 09:49Conclusion

Summary

Automatic Translation

Automatic Translation

A workflow for comprehensive micro-characterization of active optical devices is outlined. It contains structural as well as functional investigations by means of CT, LM and SEM. The method is demonstrated for a white LED which can be still be operated during characterization.

Tags

Keywords: X-ray Computed Tomography (CT)Light Microscopy (LM)Scanning Electron Microscopy (SEM)Micro-characterizationFailure AnalysisReverse EngineeringMicroelectronic DevicesOptical PropertiesMicrostructureComposite MaterialsAuto-scan OptimizerDetector ShiftSample PreparationEpoxy ResinSilver Wire

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