הדמיה ניגודיות אלקטרונים תקשור לראפיד III-V Heteroepitaxial אפיון

2:03

GaP/Si Sample Loading

2:51

Set up of Appropriate Working Conditions

3:46

Visualization of the Sample's Electron Channeling Patterns

4:35

Imaging of Defects and Features

6:13

Results: Imaging Clearly Shows the Misfit Networks in GaP/Si Samples

7:14

Conclusion