JoVE Journal
Engineering
Engineering
É necessário ter uma assinatura JoVE para assistir este Faça login ou comece sua avaliação gratuita.
Capítulos
Resumo
In this work, we describe the use of the atom-probe tomography technique for studying the grain boundaries of the absorber layer in a CIGS solar cell. A novel approach to prepare the atom probe tips containing the desired grain boundary with a known structure is also presented here.