Dual-energy X-ray Absorptiometry

Dual-energy X-ray absorptiometry (DXA) is a low-dose imaging method that measures bone mineral density and body composition, making it central to evaluating skeletal health. During a scan, two X-ray beams with different energy levels pass through the body; because bone and soft tissue attenuate each energy differently, the system calculates mineral content and tissue distribution. Clinicians use DXA to diagnose osteoporosis, estimate fracture risk, and monitor changes during treatment, while researchers apply it to study body composition, aging, nutrition, and metabolic disease. Its rapid acquisition and relatively low radiation exposure support repeated assessment over time.

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Research

JoVE Journal - Engineering
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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

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Cited by 11 •

2016

The use of energy dispersive X-ray tomography in the scanning transmission electron microscope to characterize elemental distributions within single nanoparticles in three dimensions is described.

Research

JoVE Journal - Engineering

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Cited by 10 •

2016

The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray optics.

Preparing Adherent Cells for X-ray Fluorescence Imaging by Chemical Fixation

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Cited by 14 •

2015

Here, we present a protocol on how to determine the quantity and distribution of metals in a sample using synchrotron X-ray fluorescence. We focus on adherent cells, and describe the chemical fixation method to prepare this sample. We then describe how to mount and image the sample using synchrotron X-rays.

Quantifying X-Ray Fluorescence Data Using MAPS

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Cited by 25 •

2018

Here, we demonstrate the use of the X-ray fluorescence fitting software, MAPS, created by Argonne National Laboratory for the quantification of fluorescence microscopy data. The quantified data that results is useful for understanding the elemental distribution and stoichiometric ratios within a sample of interest.

Education

JoVE Science Education - Engineering

X-ray Photoelectron Spectroscopy

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2023

Source: Faisal Alamgir, School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA X-ray photoelectron spectroscopy (XPS) is a technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top several...

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