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DOI: 10.3791/56042-v
Tara Nietzold1, Bradley M. West2, Michael Stuckelberger2, Barry Lai3, Stefan Vogt3, Mariana I Bertoni2
1School for Engineering of Matter, Transport, and Energy,Arizona State University, 2School of Electrical, Computer, and Energy Engineering,Arizona State University, 3Advanced Photon Source,Argonne National Laboratory
This study demonstrates the use of the MAPS software for quantifying fluorescence microscopy data. The resulting quantified data aids in understanding elemental distribution and stoichiometric ratios within samples.
Here, we demonstrate the use of the X-ray fluorescence fitting software, MAPS, created by Argonne National Laboratory for the quantification of fluorescence microscopy data. The quantified data that results is useful for understanding the elemental distribution and stoichiometric ratios within a sample of interest.
Synchrotronbased X-ray fluorescence is an important technique for observing elemental segregation, stoichiometry relationships and clustering behavior in samples from a multitude of fields including biology, chemistry and material science. The information obtained from these studies is qualitative until proper quantification procedures are used to convert raw fluorescence counts into elemental aerial masses. This video will demonstrate how to use the quantification program created by Argonne National Laboratory to generate numerical information for two-dimensional X-ray fluorescence maps.
To use the MAPS program, it is first necessary to download the IDL software from the Internet. This can currently be done by going to the website for IDL and creating an account. Next, select My Account then Downloads, and it will show a page of all the available programs.
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