Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

10.6K views

Cited by 15

09:09 min

August 10th, 2019

10.3791/59480-v

August 10th, 2019

10.6K views

Here, we present a protocol for efficiently combining serial block face and focused ion beam scanning electron microscopy to target an area of interest. This allows for efficient searching, in three dimensions, and locating rare events in a large field of view.

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Serial Block Face SEM

Chapters in this video

0:04

Title

0:51

Sample Fixation and Processing for Electron Microscopy

3:51

Prepare Embedded Samples for Imaging

5:03

Imaging in the SBF-SEM (Serial Block Face Scanning Electron Microscopy) and Data Processing

6:22

Imaging in the FIB-SEM (Focused Ion Beam SEM)

7:49

Results: SBF-SEM and FIB-SEM Data

8:46

Conclusion

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