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Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy
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Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy

Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy

DOI:
10.3791/61847-v

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09:47 min

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July 15, 2021

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,
1Thermo Fisher, 2Universite de Lausanne

Chapters

  • 00:04Introduction
  • 00:46Array Generation
  • 01:42Sample Sectioning
  • 02:23Array Sectioning and Transfer
  • 03:53Scanning Electron Microscopy (SEM)
  • 04:16Imaging Region Definition
  • 06:37Auto Function Configuration and Image Acquisition
  • 07:27Results: Representative Targeted Acquisition of Volume Information
  • 09:02Conclusion

Summary

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We describe the preparation of ribbons of serial sections and their collection on large transfer support for use as Array Tomography samples, along with automated imaging procedures in a scanning electron microscope. The protocol allows screening, retrieval, and targeted imaging of local, rare events, and the acquisition of large data volumes.

Tags

Keywords: Array TomographyScanning Electron MicroscopyElectron MicroscopyVolume InformationSerial SectionsData RecordingData AnalysisSample PreparationUltramicrotomeDiamond TrimmingWafer CleavingArray Tomography KnifeRibbon SectioningSample Transfer

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