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Engineering

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Author Spotlight
 
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Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Parallel Active Cantilever Arrays in AFMS to Enable High-Throughput Inspections

Article DOI: 10.3791/65210-v 01:24 min June 13th, 2023
June 13th, 2023
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