Scanning Beam Digital X-ray

Scanning beam digital X-ray is a medical imaging technique that forms radiographs by moving a narrow X-ray beam across the body while a digital detector records transmitted radiation. As the beam scans line by line, the detector measurements are combined into a two-dimensional image; restricting exposure to a small region at each moment can limit scattered radiation and improve image contrast. The method supports digital evaluation of bones, soft-tissue structures, and other anatomical features, with images that can be stored, processed, and shared electronically. It is useful in diagnostic radiography and may assist research into lower-scatter, dose-conscious imaging systems.

Scanning Beam Digital X-ray - Related Videos

Research

JoVE Journal - Engineering

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

0 Views •

Cited by 10 •

2016

The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray optics.

Preparing Adherent Cells for X-ray Fluorescence Imaging by Chemical Fixation

0 Views •

Cited by 14 •

2015

Here, we present a protocol on how to determine the quantity and distribution of metals in a sample using synchrotron X-ray fluorescence. We focus on adherent cells, and describe the chemical fixation method to prepare this sample. We then describe how to mount and image the sample using synchrotron X-rays.

Research

JoVE Journal - Neuroscience
Free Sample

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

0 Views •

Cited by 105 •

2011

This protocol describes how resin embedded brain tissue can be prepared and imaged in the three dimensions in the focussed ion beam, scanning electron microscope.

Research

JoVE Journal - Engineering
Free Sample

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

0 Views •

Cited by 4 •

2018

We use an aberration-corrected scanning transmission electron microscope to define single-digit nanometer patterns in two widely-used electron-beam resists: poly (methyl methacrylate) and hydrogen silsesquioxane. Resist patterns can be replicated in target materials of choice with single-digit nanometer fidelity using liftoff, plasma etching, and resist infiltration by organometallics.

Education

JoVE Science Education - Engineering
Free Sample

X-ray Diffraction

0 Views •

2023

Source: Faisal Alamgir, School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA X-ray diffraction (XRD) is a technique used in materials science for determining the atomic and molecular structure of a material. This is done by irradiating a sample of the material with incident X-rays and then measuring the intensities and scattering angles of the X-rays that are scattered by the material. The intensity of the scattered X-rays are plotted as a function of the...

View All Results

FAQs

Related Topics