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JoVE Journal
Engineering

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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
 

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

Article doi: 10.3791/60001
August 20th, 2019

Summary August 20th, 2019

A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.

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