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JoVE Journal
Engineering

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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
 

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Article DOI: 10.3791/60269-v 05:57 min April 1st, 2020
April 1st, 2020

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Summary

Here, we describe the operation of a SiN integrated photonic circuit containing optical phased arrays. The circuits are used to emit low divergence laser beams in the near infrared and steer them in two dimensions.

Transcript

Tags

SiN Integrated Optical Phased Arrays Wafer-scale Test Station Photonic Integrated Circuits Characterization Method Fast Automated Wafer Scale Beam-steering Circuits Prober Station Micro-electronics Industry Sylvain Guerber Post-doc Researcher Load Wafer Align Fibers Light Microscope Fiber Position Optical Phased Array Input Grating Coupler Light Intensity Output Gratings Polarization Adjustment OPA Output Imaging Far Field Imaging Sensor Exposure Time Laser Power
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