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JoVE Journal
Engineering

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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
 

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Article doi: 10.3791/60269
April 1st, 2020

Summary April 1st, 2020

Here, we describe the operation of a SiN integrated photonic circuit containing optical phased arrays. The circuits are used to emit low divergence laser beams in the near infrared and steer them in two dimensions.

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