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August 10, 2019
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Summary
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Here, we present a protocol for efficiently combining serial block face and focused ion beam scanning electron microscopy to target an area of interest. This allows for efficient searching, in three dimensions, and locating rare events in a large field of view.
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Cite this Article
Guérin, C. J., Kremer, A., Borghgraef, P., Lippens, S. Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy. J. Vis. Exp. (150), e59480, doi:10.3791/59480 (2019).
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