Journal
/
/
Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
JoVE Journal
Biology
This content is Free Access.
JoVE Journal Biology
Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

9,190 Views

09:09 min

August 10, 2019

DOI:

09:09 min
August 10, 2019

9182 Views
, , ,

Summary

Automatically generated

Here, we present a protocol for efficiently combining serial block face and focused ion beam scanning electron microscopy to target an area of interest. This allows for efficient searching, in three dimensions, and locating rare events in a large field of view.

Related Videos

Read Article