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JoVE Journal
Biology

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Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
 

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

Article DOI: 10.3791/59480
August 10th, 2019

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Summary August 10th, 2019

Here, we present a protocol for efficiently combining serial block face and focused ion beam scanning electron microscopy to target an area of interest. This allows for efficient searching, in three dimensions, and locating rare events in a large field of view.

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