Waiting
Login processing...

Trial ends in Request Full Access Tell Your Colleague About Jove
Journal / Engineering / Characterization of SiN Integrated Optical Phased …
JoVE Journal
Engineering

This content is Open Access.

JoVE Journal Engineering
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Author Spotlight: Enhancing Grasping Abilities for Hemiplegic Patients with Flexible Robotic Limbs (Video) | JoVE
Journal (Engineering)
Author Spotlight: Enhancing Grasping Abilities for Hemiplegic Patients with Flexible Robotic Limbs (Video) | JoVE
Optimized Sealing Process and Real-Time Monitoring of Glass-to-Metal Seal Structures
Journal (Engineering)
Optimized Sealing Process and Real-Time Monitoring of Glass-to-Metal Seal Structures
 

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Article DOI: 10.3791/60269-v • 05:57 min • April 1st, 2020
April 1st, 2020 •
1, 1, 1, 1, 1, 1, 1
1University Grenoble Alpes and CEA, LETI, Minatec Campus

Chapters

Summary
Automatic Translation

Here, we describe the operation of a SiN integrated photonic circuit containing optical phased arrays. The circuits are used to emit low divergence laser beams in the near infrared and steer them in two dimensions.

Tags

SiN Integrated Optical Phased Arrays Wafer-scale Test Station Photonic Integrated Circuits Characterization Method Fast Automated Wafer Scale Beam-steering Circuits Prober Station Micro-electronics Industry Sylvain Guerber Post-doc Researcher Load Wafer Align Fibers Light Microscope Fiber Position Optical Phased Array Input Grating Coupler Light Intensity Output Gratings Polarization Adjustment OPA Output Imaging Far Field Imaging Sensor Exposure Time Laser Power
Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter