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JoVE Journal Engineering
All-elektroniske nanosekund-løst Scanning Tunneling Mikroskopi
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All-elektroniske nanosekund-løst Scanning Tunneling Mikroskopi: At lette undersøgelsen af enkelt Dopant afgift Dynamics

Article DOI: 10.3791/56861-v • 11:33 min • January 19th, 2018
January 19th, 2018 •
1,2, 1, 3,4,5, 1,2,6, 1, 2, 3,4, 1,2
1Department of Physics, University of Alberta, 2National Institute for Nanotechnology, National Research Council of Canada, Edmonton, 3Max Planck Institute for the Structure and Dynamics of Matter, 4Max Planck Institute for Solid State Research, 5Department of Physics and Astronomy, University of Manitoba, 6Joint Attosecond Science Laboratory, University of Ottawa

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Vi demonstrere en all-elektroniske metode til at observere nanosekund-løst afgift dynamikken i dopant atomer silicium med en scanning tunneling mikroskop.

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Engineering sag 131 All-elektroniske tidsopløst scanning tunneling mikroskopi tidsopløst scanning tunneling spektroskopi dopant dynamics silicium dinglende obligationer all-elektronisk pumpe-sonde spektroskopi enkelt atom afgift dynamics
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