JoVE Journal
Engineering
Engineering
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章节
总结概括
We demonstrate an all-electronic method to observe nanosecond-resolved charge dynamics of dopant atoms in silicon with a scanning tunneling microscope.
需要订阅 JoVE 才能查看此 内容.
We demonstrate an all-electronic method to observe nanosecond-resolved charge dynamics of dopant atoms in silicon with a scanning tunneling microscope.