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Kvantificering af Hydrogen Koncentrationer i Surface og Interface-Lag og Bulk Materials gennem Dybde Profilering med kernereaktion Analysis

Article DOI: 10.3791/53452-v • 14:11 min • March 29th, 2016
March 29th, 2016 •
1, 1, 1, 1, 2
1Institute of Industrial Science, The University of Tokyo, 2Micro Analysis Laboratory, Tandem accelerator, The University Museum, The University of Tokyo

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Vi illustrere anvendelsen af 1H (15 N, αγ) 12 C resonant kernereaktion analyse (NRA) for kvantitativt at evaluere densiteten af hydrogenatomer på overfladen, i volumenet, og ved en grænsefladelag af faste materialer. Den nær overfladen brint dybde profilering af en Pd (110) enkelt krystal og SiO 2 / Si (100) stakke beskrives.

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Engineering Hydrogen kvantificering dybde profilering overflade brint bulk brint grænseflade brint reaktion analyse nukleare ionstråle analyse
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