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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
JoVE Journal
Ingenieurwesen
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JoVE Journal Ingenieurwesen
Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

11,567 Views

13:58 min

September 28, 2016

DOI:

13:58 min
September 28, 2016

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Summary

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This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

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