Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

Katherine J. Harry; Dilworth Y. Parkinson; Nitash P. Balsara

doi:10.3791/53021

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Ingeniería

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Análisis de Falla en Baterías Utilizando Microtomografía duro de rayos X a base de Sincrotrón

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

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Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

Análisis de Falla en Baterías Utilizando Microtomografía duro de rayos X a base de Sincrotrón

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8,874 Views

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08:11 min

•

August 26, 2015

DOI:

10.3791/53021-v

DOI:

10.3791/53021-v

•

08:11 min

August 26, 2015

•

8836 Views

Katherine J. Harry^1,2, Dilworth Y. Parkinson³, Nitash P. Balsara^2,4,5

¹Department of Materials Science and Engineering,University of California Berkeley ²Materials Science Division,Lawrence Berkeley National Laboratory ³Advanced Light Source Division,Lawrence Berkeley National Laboratory ⁴Department of Chemical and Biomolecular Engineering,University of California Berkeley ⁵Environmental Energy Technology Division,Lawrence Berkeley National Laboratory

Summary

Synchrotron-based hard X-ray microtomography is used to image the electrochemical growth of dendrites from a lithium metal electrode through a solid polymer electrolyte membrane.

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Análisis de Falla en Baterías Utilizando Microtomografía duro de rayos X a base de Sincrotrón

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