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Engineering

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JoVE Journal Engineering
Karakterisering af SiN's integrerede optiske faseinddelte systemer på en Wafer-skalateststation
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Karakterisering af SiN's integrerede optiske faseinddelte systemer på en Wafer-skalateststation

Article DOI: 10.3791/60269-v • 05:57 min • April 1st, 2020
April 1st, 2020 •
1, 1, 1, 1, 1, 1, 1
1University Grenoble Alpes and CEA, LETI, Minatec Campus

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Her beskriver vi driften af et integreret SiN-fotonisk kredsløb, der indeholder optiske faseinddelte arrays. Kredsløbene bruges til at udsende lav divergens laserstråler i den nærmeste infrarøde og styre dem i to dimensioner.

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Engineering Optiske faseinddelte arrays integrerede fotonik SiN silicium fotonik strålestyring LIDAR to-dimensioner enkelt bølgelængde
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