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Journal / Engineering / 싱크로 기반 하드 X 선 Microtomography를 사용하여 배터리의 실패…
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싱크로 기반 하드 X 선 Microtomography를 사용하여 배터리의 실패 분석
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싱크로 기반 하드 X 선 Microtomography를 사용하여 배터리의 실패 분석

Article DOI: 10.3791/53021-v • 08:12 min • August 26th, 2015
August 26th, 2015 •
1,2, 3, 2,4,5
1Department of Materials Science and Engineering, University of California Berkeley, 2Materials Science Division, Lawrence Berkeley National Laboratory, 3Advanced Light Source Division, Lawrence Berkeley National Laboratory, 4Department of Chemical and Biomolecular Engineering, University of California Berkeley, 5Environmental Energy Technology Division, Lawrence Berkeley National Laboratory

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공학 판 (102) 리튬 이온 전지 리튬 덴 드라이트의 성장 고분자 전해질 X 선 microtomography 전기 화학 X 선 촬영
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