JoVE Journal
Engineering
Engineering
이 콘텐츠 오픈 액세스로 구독없이 시청하실 수 있습니다.
챕터
요약
We present a method for achieving sub-nanometer resolution images with amplitude-modulation (tapping mode) atomic force microscopy in liquid. The method is demonstrated on commercial atomic force microscopes. We explain the rationale behind our choices of parameters and suggest strategies for resolution optimization.