Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam

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Cited by 5

10:54 min

July 26th, 2014

10.3791/51463-v

July 26th, 2014

27.2K views

Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.

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Cryo electron Microscopy

Chapters in this video

0:05

Title

1:25

Sample Freezing

3:21

Ion Milling

5:56

Cryo Transfer to TEM

8:54

Results: Visualization of Aspergillus niger Spores Using Cryo-microscopy

10:20

Conclusion

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