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Engineering
Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling w...
Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling w...
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Engineering
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JoVE Journal Engineering
Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Full Text
4,096 Views
11:03 min
July 14, 2022

DOI: 10.3791/61955-v

Taylor Moon1, Michael Colletta1, Lena F. Kourkoutis1,2

1School of Applied and Engineering Physics,Cornell University, 2Kavli Institute at Cornell for Nanoscale Science

Cryogenic Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) techniques can provide key insights into the chemistry and morphology of intact solid-liquid interfaces. Methods for preparing high quality Energy Dispersive X-ray (EDX) spectroscopic maps of such interfaces are detailed, with a focus on energy storage devices.

The cryo-SEM and FIB method can be used to study solid-liquid interfaces and biological samples while preserving the samples native structure. The main advantage of this technique is that the cryo-SEM allows the user to quickly probe the interface of macroscopic devices like coin cell battery electrodes with tens of nanometers resolution. Begin by installing a cryo-SEM stage and an anticontaminator.

Evacuate the SEM chamber and adjust the gas injection system, GIS, platinum source so that when inserted, the source will sit approximately five millimeters away from the sample surface. Set the GIS temperature to 28 degrees Celsius and open the shutter to vent the system for 30 seconds to clear out any excess material. Then, allow the SEM chamber to evacuate for a minimum of eight hours.

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