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JoVE Journal
Engineering

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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
 

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Article DOI: 10.3791/53200-v 08:12 min December 5th, 2015
December 5th, 2015

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