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A Functional Assay for Gap Junctional Examination; Electroporation of Adherent Cells on Indium-Tin Oxide
JoVE Journal
Biology
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JoVE Journal Biology
A Functional Assay for Gap Junctional Examination; Electroporation of Adherent Cells on Indium-Tin Oxide
DOI:

11:02 min

October 18, 2014

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Chapters

  • 00:00Title
  • 01:50Cell Plating and Electroporation
  • 05:38Fixing the Cells
  • 08:55Electroporation of a Peptide to Inhibit Erk Activation
  • 10:11Conclusion

Summary

Automatic Translation

This presentation demonstrates a method whereby electroporation of adherent, cultured cells is used for the study of intercellular, junctional communication, while the cells grow on a slide coated with conductive and transparent indium-tin oxide.

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