Waiting
登录处理中...

Trial ends in Request Full Access Tell Your Colleague About Jove
Journal / Engineering / Characterization of SiN Integrated Optical Phased …
JoVE Journal
Engineering

这篇 内容 是开放权限的.

JoVE Journal Engineering
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Focused Ion Beam Fabrication of LiPON-based Solid-state Lithium-ion Nanobatteries for In Situ Testing
Journal (Engineering)
Focused Ion Beam Fabrication of LiPON-based Solid-state Lithium-ion Nanobatteries for In Situ Testing
Micropunching Lithography for Generating Micro- and Submicron-patterns on Polymer Substrates
Journal (Engineering)
Micropunching Lithography for Generating Micro- and Submicron-patterns on Polymer Substrates
 

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Article DOI: 10.3791/60269-v • 05:57 min • April 1st, 2020
April 1st, 2020 •
1, 1, 1, 1, 1, 1, 1
1University Grenoble Alpes and CEA, LETI, Minatec Campus

章节

总结概括
Automatic Translation

Here, we describe the operation of a SiN integrated photonic circuit containing optical phased arrays. The circuits are used to emit low divergence laser beams in the near infrared and steer them in two dimensions.

Tags

SiN Integrated Optical Phased Arrays Wafer-scale Test Station Photonic Integrated Circuits Characterization Method Fast Automated Wafer Scale Beam-steering Circuits Prober Station Micro-electronics Industry Sylvain Guerber Post-doc Researcher Load Wafer Align Fibers Light Microscope Fiber Position Optical Phased Array Input Grating Coupler Light Intensity Output Gratings Polarization Adjustment OPA Output Imaging Far Field Imaging Sensor Exposure Time Laser Power
Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter