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JoVE Journal
Engineering

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Scanning-probe Single-electron Capacitance Spectroscopy
 

Scanning-probe Single-electron Capacitance Spectroscopy

Article DOI: 10.3791/50676
July 30th, 2013

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Summary July 30th, 2013

Scanning-probe single-electron capacitance spectroscopy facilitates the study of single-electron motion in localized subsurface regions. A sensitive charge-detection circuit is incorporated into a cryogenic scanning probe microscope to investigate small systems of dopant atoms beneath the surface of semiconductor samples.

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