Waiting
Login processing...

Trial ends in Request Full Access Tell Your Colleague About Jove
JoVE Journal
Engineering

A subscription to JoVE is required to view this content.
You will only be able to see the first 2 minutes.

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
 

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Article DOI: 10.3791/54235
September 28th, 2016

Chapters

Summary September 28th, 2016

This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

Transcript

Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter