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Engineering

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy
 

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Article doi: 10.3791/56861
January 19th, 2018

Summary January 19th, 2018

We demonstrate an all-electronic method to observe nanosecond-resolved charge dynamics of dopant atoms in silicon with a scanning tunneling microscope.

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