Waiting
Login processing...

Trial ends in Request Full Access Tell Your Colleague About Jove
JoVE Journal
Engineering

A subscription to JoVE is required to view this content.
You will only be able to see the first 2 minutes.

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
 

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Article DOI: 10.3791/54030
July 12th, 2016

Chapters

Summary July 12th, 2016

A method for electrochemically etching field emission tips is presented. Etching parameters are characterized and the operation of the tips in field emission mode is investigated.

Transcript

Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter