Login processing...

Trial ends in Request Full Access Tell Your Colleague About Jove
JoVE Journal
Engineering

This content is Open Access.

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
 

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Article doi: 10.3791/59007
April 18th, 2019

Summary April 18th, 2019

As one of the important physical parameters in semiconductors, carrier lifetime is measured herein via a protocol employing the microwave photoconductivity decay method.

Transcript

Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
simple hit counter