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Engineering

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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
 

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Article DOI: 10.3791/59007-v 07:38 min April 18th, 2019
April 18th, 2019

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Summary

As one of the important physical parameters in semiconductors, carrier lifetime is measured herein via a protocol employing the microwave photoconductivity decay method.

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Carrier Lifetime Measurements Semiconductors Microwave Photoconductivity Decay Method Micro-PCD Aberration Materials N-type 4H Silicon Carbide Epilayer Ultrasonic Washer Sulfuric Acid Hydrogen Chloride Sodium Sulfate Sodium Hydroxide Hydrofluoric Acid Aqueous Solution Quartz Cell Measuring Equipment Pulsed Laser
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