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JoVE Journal
Engineering

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微波导光衰减法测量半导体中的载波寿命
 
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微波导光衰减法测量半导体中的载波寿命

Article doi: 10.3791/59007
April 18th, 2019

Summary April 18th, 2019

Please note that all translations are automatically generated.

Click here for the English version.

作为半导体中重要的物理参数之一, 本文采用微波光导性衰减法的协议对载流子寿命进行了测量。

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