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Journal
/
Engineering
/
使用
25
Mg + 荧光对真空窗双参考
进行
原点测量
JoVE Journal
Engineering
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JoVE Journal
Engineering
In Situ Measurement of Vacuum Window Birefringence using
25
Mg
+
Fluorescence
Please note that all translations are automatically generated.
Click here for the English version.
使用
25
Mg + 荧光对真空窗双参考
进行
原点测量
DOI:
10.3791/61175-v
•
07:03 min
•
June 13, 2020
•
W. H. Yuan
,
H. L. Liu
,
W. Z. Wei
,
Z. Y. Ma
,
P. Hao
,
Z. Deng
,
K. Deng
,
J. Zhang
,
Z. H. Lu
1
MOE Key Laboratory of Fundamental Physical Quantities Measurement, Hubei Key Laboratory of Gravitation and Quantum Physics, PGMF and School of Physics
,
Huazhong University of Science and Technology
Chapters
00:04
Introduction
01:06
A and B Polarizer Reference Direction Setup
02:00
Waveplate Azimuthal Angles Reference Angle Setup
02:51
Single
25
Mg
+
Ion Doppler Cooling
03:30
Doppler Cooling Laser Frequency Wavelength Meter Locking
04:01
Laser Intensity Setup
04:33
Vacuum Window Birefringence Measurement
04:59
Results: Representative Vacuum Window Birefringence Analyses
06:08
Conclusion
Summary
Automatic Translation
English (Original)
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Automatic Translation
此处介绍的是一种测量真空窗的双反数的方法,方法是最大化多普勒在离子陷阱中冷却
25
Mg + 离子
发出的
荧光计数。真空窗的双反光将改变激光的极化状态,通过改变外波板的分角可以补偿。
Tags
In-situ Measurement
Vacuum Window Birefringence
25Mg+ Fluorescence
Polarization Compensation
Cold Atoms
Ion Trap
Doppler Cooling
Magnesium-25 Ions
Polarizer
Wave Plate
Laser Beam
Vacuum Chamber
Article
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