National Institute of Advanced Industrial Science and Technology (AIST) 1 article published in JoVE Engineering Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes Qinghua Wang1, Shien Ri1, Hiroshi Tsuda1 1Research Institute for Measurement and Analytical Instrumentation, National Institute of Advanced Industrial Science and Technology (AIST) A sampling moiré technique featuring 2-pixel and multi-pixel sampling methods for high-accuracy strain distribution measurements at the micro/nano-scale is presented here.
