3 articles published in JoVE
Visual Evoked Potential Recordings in Mice Using a Dry Non-invasive Multi-channel Scalp EEG Sensor Chanmi Yeon1, Donghyeon Kim2, Kiseon Kim2, Euiheon Chung1,3 1Department of Biomedical Science and Engineering (BMSE), Gwangju Institute of Science and Technology (GIST), 2School of Electrical Engineering and Computer Science (EECS), Gwangju Institute of Science and Technology (GIST), 3School of Mechanical Engineering (SME), Gwangju Institute of Science and Technology (GIST) We designed a dry-type 16 channel EEG sensor which is non-invasive, deformable, and re-usable. This paper describes the whole process from manufacturing the proposed EEG electrode to signal processing of visual evoked potential (VEP) signals measured on a mouse scalp using a dry non-invasive multi-channel EEG sensor.
Fabrication of Fine Electrodes on the Tip of Hypodermic Needle Using Photoresist Spray Coating and Flexible Photomask for Biomedical Applications Joho Yun1, Jinhwan Kim2, Jong-Hyun Lee1,2 1Department of Biomedical Science and Engineering, Gwangju Institute of Science and Technology (GIST), 2School of Mechanical Engineering, Gwangju Institute of Science and Technology (GIST) The fabrication method for fine interdigitated electrodes (gap and width: 20 µm) at the tip of a hypodermic needle (diameter: 720 µm) is demonstrated using a spray coating and flexible film photomask in the photolithography process.
Fabrication of Ultra-thin Color Films with Highly Absorbing Media Using Oblique Angle Deposition Young Jin Yoo1, Gil Ju Lee1, Kyung-In Jang2, Young Min Song1 1School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, 2Department of Robotics Engineering, Daegu Gyeongbuk Institute of Science and Technology We present a detailed method for fabricating ultra-thin color films with improved characteristics for optical coatings. The oblique angle deposition technique using an electron beam evaporator allows improved color tunability and purity. Fabricated films of Ge and Au on Si substrates were analyzed by reflectance measurements and color information conversion.