2 articles published in JoVE
User-friendly, High-throughput, and Fully Automated Data Acquisition Software for Single-particle Cryo-electron Microscopy Anil Kumar1, Surekha P.1, Sahil Gulati2, Somnath Dutta1 1Molecular Biophysics Unit, Indian Institute of Science, 2Gatan Inc. Single-particle cryo-electron microscopy demands a suitable software package and user-friendly pipeline for high-throughput automatic data acquisition. Here, we present the application of a fully automated image acquisition software package, Latitude-S, and a practical pipeline for data collection of vitrified biomolecules under low-dose conditions.
Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam Stefano Rubino1,4, Petter Melin3, Paul Spellward2, Klaus Leifer1 1Department of Engineering Sciences, Uppsala University, 2Gatan Inc., 3Department of Microbiology, Swedish University of Agricultural Sciences, 4Physics Department, University of Oslo Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.