Method Article

Quantifying X-Ray Fluorescence Data Using MAPS

DOI:

10.3791/56042

February 17th, 2018

In This Article

Summary

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Here, we demonstrate the use of the X-ray fluorescence fitting software, MAPS, created by Argonne National Laboratory for the quantification of fluorescence microscopy data. The quantified data that results is useful for understanding the elemental distribution and stoichiometric ratios within a sample of interest.

Abstract

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The quantification of X-ray fluorescence (XRF) microscopy maps by fitting the raw spectra to a known standard is crucial for evaluating chemical composition and elemental distribution within a material. Synchrotron-based XRF has become an integral characterization technique for a variety of research topics, particularly due to its non-destructive nature and its high sensitivity. Today, synchrotrons can acquire fluorescence data at spatial resolutions well below a micron, allowing for the evaluation of compositional variations at the nanoscale. Through proper quantification, it is then possible to obtain an in-depth, high-resolution understanding of elemental segregation, stoichiometric relationships, and clustering behavior.

This article explains how to use the MAPS fitting software developed by Argonne National Laboratory for the quantification of full 2-D XRF maps. We use as an example results from a Cu(In,Ga)Se2 solar cell, taken at the Advanced Photon Source beamline 2-ID-D at Argonne National Laboratory. We show the standard procedure for fitting raw data, demonstrate how to evaluate the quality of a fit and present the typical outputs generated by the program. In addition, we discuss in this manuscript certain software limitations and offer suggestions for how to further correct the data to be numerically accurate and representative of spatially resolved, elemental concentrations.

Introduction

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Synchrotron-based XRF has been used across multiple disciplines for many decades. For example, it has been used in biology on studies such as that done by Geraki et al., in which they quantified trace amounts of metal concentrations within cancerous and non-cancerous breast tissue 1. More generally, quantitative XRF has been applied to a wide array of biology studies concerned with metal concentrations in cells and tissues, as described by Paunesku et al.2. Similarly, marine protists were studied for trace elements 3,4 and even micro- and macron....

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Protocol

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NOTE: Prior to beginning the fitting, it is important to know a few things about the measurements taken: the number of detector elements used - different beamlines use different detectors which are sometimes segmented into smaller sections from which the counts are read and compiled; the incident energy used; and the standard measured. This information will be applied throughout different aspects of the procedure.

1. Setting up the program

  1. Download the IDL and the MAPS program
    NOTE: Links for downloading MAPS and IDL can be found at  http://www.stefan.vogt.net/downloads.html and http://www.harrisgeos....

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Results

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An example of proper fitting results can be seen in the following Figures. Firstly, in Figure 1 a direct comparison is shown between a poor fit and a good fit for the integral spectrum. The bad fit is reparable by both ensuring no elements are missing, for instance copper, which has a clear peak in Figure 1(left) but is not being included in the fit, and adjusting the branching ratios of the L and K lines to improve the accuracy........

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Discussion

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The figures show the importance of fitting data using this procedure. Figures 1 (right) and 2 (bottom) show a representative result that should arise from a proper fitting. If there is an insufficient fit, the integral spectrum image will look noticeably off and the resulting quantified data will have errors in it, although these will be hard to detect in most cases. For certain sample types for which the standard is not representative of the elements in the sample, particularly in that the samples do no.......

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Disclosures

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The authors have nothing to disclose.

Acknowledgements

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We acknowledge funding from the U.S. Department of Energy under contract DE-EE0005948. Use of the Center for Nanoscale Materials and the Advanced Photon Source, both Office of Science user facilities, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. This material is based upon work supported in part by the National Science Foundation (NSF) and the Department of Energy (DOE) under NSF CA No. EEC-1041895. Video editing was done by VISLAB at Arizona State University. Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do....

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References

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  1. Geraki, K., Farquharson, M. J., Bradley, D. A. X-ray fluorescence and energy dispersive x-ray diffraction for the quantification of elemental concentrations in breast tissue. Phys. Med. Biol. 49, 99-110 (2004).
  2. Paunesku, T., Vogt, S., Maser, J., Lai, B., Woloschak, G.

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Tags

X ray FluorescenceMAPS SoftwareSynchrotron XRFElemental QuantificationSpectral FittingData NormalizationDetector ConfigurationFit ParametersIntegrated SpectraElemental Mapping

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