Engineering
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Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
Chapters
Summary April 22nd, 2013
In this work, we describe the use of the atom-probe tomography technique for studying the grain boundaries of the absorber layer in a CIGS solar cell. A novel approach to prepare the atom probe tips containing the desired grain boundary with a known structure is also presented here.
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