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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
JoVE Journal
Engineering
Author Produced
This content is Free Access.
JoVE Journal Engineering
Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
DOI:

12:18 min

June 27, 2022

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Chapters

  • 00:05Introduction
  • 01:08Sample Preparation for Co-Localized Imaging of a Metal Alloy
  • 02:11KPFM Imaging
  • 06:51SEM, EDS, and EBSD Imaging
  • 07:41KPFM, SEM, EDS, and EBSD Image Overlay and Analysis
  • 09:37Results I: 3D Printed Ternary Ti Alloy: KPFM and SEM/EBSD
  • 10:41Results II: Cross-Sectional Analysis of Zr Alloys for Nuclear Cladding: KPFM, SEM, and Raman
  • 11:21Conclusion

Summary

Automatic Translation

Kelvin probe force microscopy (KPFM) measures surface topography and differences in surface potential, while scanning electron microscopy (SEM) and associated spectroscopies can elucidate surface morphology, composition, crystallinity, and crystallographic orientation. Accordingly, the co-localization of SEM with KPFM can provide insight into the effects of nanoscale composition and surface structure on corrosion.

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