Login processing...

Trial ends in Request Full Access Tell Your Colleague About Jove
JoVE Journal
Engineering

You have full access to this content through Seoul National University of Education

Contact ohmique fabrication utilisant une technique Focused Ion Beam-et caractérisation électrique pour la couche semi-conducteurs Nanostructures
 
Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
simple hit counter