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Portador de por vida medidas en semiconductores a través del método de decaimiento de fotoconductividad de microondas
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Portador de por vida medidas en semiconductores a través del método de decaimiento de fotoconductividad de microondas

Article DOI: 10.3791/59007-v • 07:38 min • April 18th, 2019
April 18th, 2019 •
1, 1, 1,2
1Department of Electrical & Mechanical Engineering, Nagoya Institute of Technology, 2Frontier Research Institute for Material Science, Nagoya Institute of Technology

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Como uno de los parámetros físicos importantes en semiconductores, vida de portador se mide aquí mediante un protocolo que emplea el método de decaimiento de fotoconductividad de microondas.

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Ingeniería número 146 microondas fotoconductividad decaimiento método duración de la carrera material semiconductor tiempo resuelta la medida caracterización del defecto recombinación superficial
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