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Journal / Engineering / 微米/纳米尺度应变分布测量从采样莫尔条纹…
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微米/纳米尺度应变分布测量从采样莫尔条纹
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微米/纳米尺度应变分布测量从采样莫尔条纹

Article DOI: 10.3791/55739-v • 06:56 min • May 23rd, 2017
May 23rd, 2017 •
1, 1, 1
1Research Institute for Measurement and Analytical Instrumentation, National Institute of Advanced Industrial Science and Technology (AIST)

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这里介绍了采用2像素和多像素采样方法进行微/纳米级高精度应变分布测量的采样莫尔技术。

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工程，第123期，变形分布，应变测量，采样莫尔，图像处理，光学方法，微/纳米级，复合材料
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