Deepak Goyal

Assembly Test and Technology Development Failure Analysis Labs

Intel Corporation

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El uso de la radiación del sincrotrón Microtomografía encargado de investigar multi-escala Paquetes microelectrónicos tridimensionales

1Materials Engineering Division, Lawrence Livermore National Laboratory, 2Assembly Test and Technology Development Failure Analysis Labs, Intel Corporation, 3Advanced Light Source, Lawrence Berkeley National Laboratory

JoVE 53683

 Engineering