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L'applicazione di X-ray Imaging cristallo Spettroscopia per l'uso come ad alta temperatura del plasma di diagnostica
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L'applicazione di X-ray Imaging cristallo Spettroscopia per l'uso come ad alta temperatura del plasma di diagnostica

Article DOI: 10.3791/54408-v • 06:46 min • August 25th, 2016
August 25th, 2016 •
1, 2, 3
1Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 2Department of Physics, Massachusetts Institute of Technology, 3Plasma Science and Fusion Center, Massachusetts Institute of Technology

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spettri a raggi X offrono una ricchezza di informazioni sui plasmi ad alta temperatura. Questo manoscritto presenta il funzionamento di una risoluzione elevata lunghezza d'onda spazialmente l'imaging spettrometro a raggi X utilizzato per visualizzare ioni a idrogeno ed elio-come elementi di numero atomico medio in un plasma tokamak.

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Ingegneria X-Ray Spectroscopy Crystal Spettroscopia fisica del plasma fusion Tokamak diagnostica del plasma
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