Journal
/
Engineering
/
Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope
JoVE Journal
Engineering
A subscription to JoVE is required to view this content.  Sign in or start your free trial.
JoVE Journal Engineering
Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope

DOI:
10.3791/59203-v

•

09:06 min

•

March 24, 2019

•

, , , , ,
1Department of Physics, Applied Physics and Astronomy,Binghamton University, 2Institute of Physics,University of Silesia

Chapters

  • 00:04Title
  • 01:13Mechanical Uniaxial-strain Device Setup
  • 02:17Strain Application
  • 04:22STM Experiments
  • 05:52Single Antiferromagnetic Domain on Strained Fe1+yTe
  • 08:12Conclusion

Summary

Automatic Translation

Automatic Translation

Using uniaxial strain combined with spin-polarized scanning tunneling microscopy, we visualize and manipulate the antiferromagnetic domain structure of Fe1+yTe, the parent compound of iron-based superconductors.

Tags

Keywords: Uniaxial-strainAntiferromagnetic DomainsFe1+YTeSpin-polarized Scanning Tunneling MicroscopeHigh Temperature SuperconductorsBroken Symmetry StatesSingle CrystalSDM-compatibleDevice TestingVisual Demonstration

Article

Embed

ADD TO PLAYLIST

Usage Statistics

Related Videos

check_url/59203?article_type=v

Scanning-probe Single-electron Capacitance Spectroscopy
check_url/59203?article_type=v

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
check_url/59203?article_type=v

Visualizing Hyporheic Flow Through Bedforms Using Dye Experiments and Simulation
check_url/59203?article_type=v

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
check_url/59203?article_type=v

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
check_url/59203?article_type=v

Hand Controlled Manipulation of Single Molecules via a Scanning Probe Microscope with a 3D Virtual Reality Interface
check_url/59203?article_type=v

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy
check_url/59203?article_type=v

Scanning SQUID Study of Vortex Manipulation by Local Contact
check_url/59203?article_type=v

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
check_url/59203?article_type=v

Demonstration of a Hyperlens-integrated Microscope and Super-resolution Imaging

Read Article