Waiting
登录处理中...

Trial ends in Request Full Access Tell Your Colleague About Jove
JoVE Journal
Biology
Author Produced

需要订阅 JoVE 才能查看此 内容. 登录或开始免费试用。

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
 

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Article DOI: 10.3791/64823-v 05:34 min June 30th, 2023
June 30th, 2023

章节

Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter