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Bruke Synchrotron Radiation microtomography å etterforske Multi-skala Tredimensjonal Mikro Pakker
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Bruke Synchrotron Radiation microtomography å etterforske Multi-skala Tredimensjonal Mikro Pakker

Article DOI: 10.3791/53683-v • 08:46 min • April 13th, 2016
April 13th, 2016 •
1, 1, 2, 2, 2, 3, 3
1Materials Engineering Division, Lawrence Livermore National Laboratory, 2Assembly Test and Technology Development Failure Analysis Labs, Intel Corporation, 3Advanced Light Source, Lawrence Berkeley National Laboratory

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For denne studien synkrotronstråling mikro-tomografi, en ikke-destruktiv tredimensjonale avbildningsteknikk er anvendt for å undersøke en hel mikroelektroniske pakke med et tverrsnittsareal på 16 x 16 mm. På grunn av synkrotron høye flux og lysstyrke prøven ble fotografert i bare 3 min med en 8,7 mikrometer romlig oppløsning.

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Engineering Synkrotronstråling mikro-tomografi røntgen computertomografi ikke-destruktiv feil analyse bly gratis lodde og tre-dimensjonale mikroelektroniske pakker
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