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Chemistry
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利用飞行时二次离子质谱法成像金属颜料界面的腐蚀
JoVE Journal
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JoVE Journal
Chemistry
Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
Please note that all translations are automatically generated.
Click here for the English version.
利用飞行时二次离子质谱法成像金属颜料界面的腐蚀
DOI:
10.3791/59523-v
•
07:24 min
•
May 06, 2019
•
Jennifer Yao
,
Anthony Guzman
,
Zihua Zhu
,
Xiao-Ying Yu
1
Earth and Biological Sciences Directorate
,
Pacific Northwest National Laboratory
,
2
Energy and Environment Directorate
,
Pacific Northwest National Laboratory
,
3
Wiley Environmental Molecular Sciences Laboratory
,
Pacific Northwest National Laboratory
Chapters
00:04
Title
00:55
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Analysis of the Metal-Paint Corrosion Interface
05:32
Results: Comparison of Corroded and Non-Corroded Aluminum-Paint Interfaces
06:16
Conclusion
Summary
Automatic Translation
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Automatic Translation
与暴露在空气中的试样相比, 采用飞行时间二次离子质谱法, 在铝合金的金属漆界面上进行化学映射和腐蚀形态。
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